Scanning interferometric apertureless microscopy : optical imaging at 10 angstroms resolution
- Author
- ZENHAUSERN, F; MARTIN, Y; WICKRAMASINGHE, H. K
IBM, T. J. Watson res. cent., res. div., Yorktown Heights NY 10598, United States - Source
Science (Washington, D.C.). 1995, Vol 269, Num 5227, pp 1083-1085
- CODEN
- SCIEAS
- ISSN
- 0036-8075
- Scientific domain
- Multidisciplinary
- Publisher
- American Association for the Advancement of Science, Washington, DC
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Imagerie Interférométrie Microscopie optique Vibration mécanique 0779F Microscopie champ proche Microscopie optique champ proche Pointe microscope
- Keyword (en)
- Imagery Interferometry Optical microscopy Mechanical vibrations Scanning probe microscopy Near field scanning optical microscopy Microscope tip
- Keyword (es)
- Imaginería
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G79 Scanning probe microscopes, components and techniques / 001B00G79F Near-field scanning optical microscopes
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3683337
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1126/science.269.5227.1083 
https://dx.doi.org/10.1126/science.269.5227.1083
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