Structural evaluation of epitaxially grown organic evaporated films by total reflection x-ray diffractometer
- Author
- ISHIDA, K; HAYASHI, K; YOSHIDA, Y; HORIUCHI, T; MATSUSHIGE, K
Kyushu univ., fac. eng., dep. applied sci., Higashi-ku, Fukuoka 812, Japan - Source
Journal of applied physics. 1993, Vol 73, Num 11, pp 7338-7343 ; 1 ; ref : 23 ref
- CODEN
- JAPIAU
- ISSN
- 0021-8979
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics; Physics
- Publisher
- American Institute of Physics, Woodbury, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Couche mince Croissance cristalline Epitaxie Etude expérimentale Evaporation sous vide Hydrocarbure Orientation moléculaire Paraffine Réflexion Vieillissement XRD Composé organique
- Keyword (en)
- Thin films Crystal growth Epitaxy Experimental study Vacuum evaporation Hydrocarbons Molecular orientation Paraffin Reflection Aging XRD Organic compounds
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering / 001B60A10H X-ray absorption spectroscopy: exafs, nexafs, xanes, etc
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15K Vapor phase epitaxy; growth from vapor phase
- Discipline
- Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3763448
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.354024 
https://dx.doi.org/10.1063/1.354024
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