Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis
- Author
- MATHIEU, H. J
Ecole polytech. fédérale Lausanne, dép. matériaux, lab. métallurgie chimique, 1015 Lausanne, Switzerland - Source
Analusis (Imprimé). 1993, Vol 21, Num 8, pp M17-M19 ; ref : 5 ref
- ISSN
- 0365-4877
- Scientific domain
- Analytical chemistry
- Publisher
- EDP Sciences, Les Ulis
- Publication country
- France
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse chimique Analyse surface Biopolymère Composition chimique Couche mince Céramique Distribution concentration Oxyde Rayon X Spectrométrie photoélectron Uréthanne polymère
- Keyword (en)
- Chemical analysis Surface analysis Biopolymer Chemical composition Thin film Ceramic materials Concentration distribution Oxides X ray Photoelectron spectrometry Polyurethane
- Keyword (es)
- Análisis químico Análisis superficie Biopolímero Composición química Capa fina Cerámica Distribución concentración Óxido Rayos X Espectrometría fotoelectrón Uretano polímero
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods
- Discipline
- Analytical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3778576
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Install on your browser
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:9:\"\u0000*\u0000jtitle\";s:19:\"Analusis (Imprim\u00e9)\";s:9:\"\u0000*\u0000stitle\";s:16:\"Analusis (Impr.)\";s:7:\"\u0000*\u0000date\";s:4:\"1993\";s:9:\"\u0000*\u0000volume\";s:2:\"21\";s:8:\"\u0000*\u0000issue\";s:1:\"8\";s:8:\"\u0000*\u0000spage\";s:3:\"M17\";s:8:\"\u0000*\u0000epage\";s:3:\"M19\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0365-4877\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"MATHIEU\";s:10:\"\u0000*\u0000aufirst\";s:4:\"H. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:8:\"\u0000*\u0000place\";s:8:\"Les Ulis\";s:6:\"\u0000*\u0000pub\";s:12:\"EDP Sciences\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:9:\"\u0000*\u0000jtitle\";s:19:\"Analusis (Imprim\u00e9)\";s:9:\"\u0000*\u0000stitle\";s:16:\"Analusis (Impr.)\";s:7:\"\u0000*\u0000date\";s:4:\"1993\";s:9:\"\u0000*\u0000volume\";s:2:\"21\";s:8:\"\u0000*\u0000issue\";s:1:\"8\";s:8:\"\u0000*\u0000spage\";s:3:\"M17\";s:8:\"\u0000*\u0000epage\";s:3:\"M19\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0365-4877\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"MATHIEU\";s:10:\"\u0000*\u0000aufirst\";s:4:\"H. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:8:\"\u0000*\u0000place\";s:8:\"Les Ulis\";s:6:\"\u0000*\u0000pub\";s:12:\"EDP Sciences\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:9:\"\u0000*\u0000jtitle\";s:19:\"Analusis (Imprim\u00e9)\";s:9:\"\u0000*\u0000stitle\";s:16:\"Analusis (Impr.)\";s:7:\"\u0000*\u0000date\";s:4:\"1993\";s:9:\"\u0000*\u0000volume\";s:2:\"21\";s:8:\"\u0000*\u0000issue\";s:1:\"8\";s:8:\"\u0000*\u0000spage\";s:3:\"M17\";s:8:\"\u0000*\u0000epage\";s:3:\"M19\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0365-4877\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"MATHIEU\";s:10:\"\u0000*\u0000aufirst\";s:4:\"H. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:8:\"\u0000*\u0000place\";s:8:\"Les Ulis\";s:6:\"\u0000*\u0000pub\";s:12:\"EDP Sciences\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:9:\"\u0000*\u0000jtitle\";s:19:\"Analusis (Imprim\u00e9)\";s:9:\"\u0000*\u0000stitle\";s:16:\"Analusis (Impr.)\";s:7:\"\u0000*\u0000date\";s:4:\"1993\";s:9:\"\u0000*\u0000volume\";s:2:\"21\";s:8:\"\u0000*\u0000issue\";s:1:\"8\";s:8:\"\u0000*\u0000spage\";s:3:\"M17\";s:8:\"\u0000*\u0000epage\";s:3:\"M19\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0365-4877\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"MATHIEU\";s:10:\"\u0000*\u0000aufirst\";s:4:\"H. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:8:\"\u0000*\u0000place\";s:8:\"Les Ulis\";s:6:\"\u0000*\u0000pub\";s:12:\"EDP Sciences\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:9:\"\u0000*\u0000jtitle\";s:19:\"Analusis (Imprim\u00e9)\";s:9:\"\u0000*\u0000stitle\";s:16:\"Analusis (Impr.)\";s:7:\"\u0000*\u0000date\";s:4:\"1993\";s:9:\"\u0000*\u0000volume\";s:2:\"21\";s:8:\"\u0000*\u0000issue\";s:1:\"8\";s:8:\"\u0000*\u0000spage\";s:3:\"M17\";s:8:\"\u0000*\u0000epage\";s:3:\"M19\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0365-4877\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"MATHIEU\";s:10:\"\u0000*\u0000aufirst\";s:4:\"H. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:93:\"Surface chemical analysis of materials by X-ray photoelectron spectroscopy : Surface analysis\";s:8:\"\u0000*\u0000place\";s:8:\"Les Ulis\";s:6:\"\u0000*\u0000pub\";s:12:\"EDP Sciences\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
arXiv access
