Optical field enhanced multiphoton photoemission in copper mirrors
- Author
- SRINIVASAN-RAO, T; FISCHER, J; TSANG, T
Brookhaven national lab., Upton NY 11973, United States - Source
Applied physics letters. 1993, Vol 63, Num 12, pp 1595-1597 ; ref : 9 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Cuivre Domaine temps fs Emission photoélectronique Faisceau laser Impulsion Miroir Métal Source électron
- Keyword (en)
- Copper fs range Photoelectron emission Laser beams Pulses Mirrors Metals Electron sources
- Keyword (es)
- Emisión fotoelectrónica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B20 Nuclear physics / 001B20I Experimental methods and instrumentation for elementary-particle and nuclear physics / 001B20I25 Particle sources and targets / 001B20I25B Electron sources
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I60 Photoemission and photoelectron spectra / 001B70I60B Clean metal, semiconductor, and insulator surfaces
- Discipline
- Nuclear physics Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3798197
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.110757 
https://dx.doi.org/10.1063/1.110757
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