Structural and analytical characterization of an iridium oxide thin layer
- Author
- BESTAOUI, N; PROUZET, E; DENIARD, P; BREC, R
CNRS, lab. chimie solides, IMN, 44072 Nantes, France - Source
Thin solid films. 1993, Vol 235, Num 1-2, pp 35-42 ; ref : 17 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé binaire Couche mince Iridium oxyde Monocristal Structure cristalline XRD Ir O IrO2
- Keyword (en)
- Binary compounds Thin films Iridium oxides Monocrystals Crystal structure XRD
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A66 Structure of specific crystalline solids / 001B60A66F Inorganic compounds / 001B60A66F7 Miscellaneous
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3807706
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0040-6090(93)90239-L 
https://dx.doi.org/10.1016/0040-6090(93)90239-L
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