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Peak profiles of ions originating from solid surfaces in time-of-flight mass spectrometers incorporating reflectrons

Author
IOANOVICIU, D; CUNA, C; ARDELEAN, P
Inst. isotopic molecular technology, 3400 Cluj-Napoca, Romania
Source

Rapid communications in mass spectrometry. 1993, Vol 7, Num 11, pp 999-1002 ; ref : 6 ref

ISSN
0951-4198
Scientific domain
Organic chemistry
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Désorption Forme Ionisation Laser Pic Plasma Réflecteur Simulation ordinateur Solide Spectromètre masse temps vol Surface
Keyword (en)
Desorption Shape Ionization Lasers Peaks Plasma Reflectors Computerized simulation Solids Time-of-flight mass spectrometers Surfaces
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G75 Mass spectrometers and related techniques

Pacs
0775 Mass spectrometers and related techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3892816

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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