Peak profiles of ions originating from solid surfaces in time-of-flight mass spectrometers incorporating reflectrons
- Author
- IOANOVICIU, D; CUNA, C; ARDELEAN, P
Inst. isotopic molecular technology, 3400 Cluj-Napoca, Romania - Source
Rapid communications in mass spectrometry. 1993, Vol 7, Num 11, pp 999-1002 ; ref : 6 ref
- ISSN
- 0951-4198
- Scientific domain
- Organic chemistry
- Publisher
- Wiley, Chichester
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Désorption Forme Ionisation Laser Pic Plasma Réflecteur Simulation ordinateur Solide Spectromètre masse temps vol Surface
- Keyword (en)
- Desorption Shape Ionization Lasers Peaks Plasma Reflectors Computerized simulation Solids Time-of-flight mass spectrometers Surfaces
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G75 Mass spectrometers and related techniques
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3892816
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/rcm.1290071107 
https://dx.doi.org/10.1002/rcm.1290071107
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