Sudden beginning of metallic behavior at Ag/Si(100) interface : a real-time photoreflectance-spectroscopy investigation
- Author
- BORENSZTEIN, Y; ALAMEH, R; ROY, M
Univ. Pierre et Marie Curie, lab. optique solides, 75252 Paris, France - Source
Physical review. B, Condensed matter. 1993, Vol 48, Num 19, pp 14737-14740 ; ref : 17 ref
- CODEN
- PRBMDO
- ISSN
- 0163-1829
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- American Institute of Physics, Woodbury, NY
/
American Physical Society, Woodbury, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Argent Degré recouvrement Etude expérimentale Interface solide solide Liaison covalente Matériau semiconducteur Modulation optique Réflexion optique Silicium Ag Si Transition métal non métal Métal transition
- Keyword (en)
- Silver Coverage rate Experimental study Solid-solid interfaces Covalent bonds Semiconductor materials Optical modulation Optical reflection Silicon Metal non metal transition Transition elements
- Keyword (es)
- Grado recubrimiento
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A30 Metal-insulator transitions and other electronic transitions
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C20 Surface and interface electron states / 001B70C20A Surface states, band structure, electron density of states
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3895820
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevB.48.14737 
https://dx.doi.org/10.1103/PhysRevB.48.14737
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