Surface and depth profiling techniques using XPS applied to the study of nickel-containing environmental particles
- Author
- RICKMAN, J. T1 ; LINTON, R. W
[1] Hoechst Celanese Corp., Sunette div., Somerset NJ 08873, United States - Source
Applied surface science. 1993, Vol 68, Num 3, pp 375-393 ; ref : 18 ref
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse chimique Analyse surface Lessivage Particule en suspension Pollution air Profil profondeur Rayon X Spectrométrie photoélectron Ni
- Keyword (en)
- Chemical analysis Surface analysis Leaching Suspended particle Air pollution Depth profile X ray Photoelectron spectrometry
- Keyword (es)
- Análisis químico Análisis superficie Lavado Partícula en suspensión Contaminación aire Perfil profundidad Rayos X Espectrometría fotoelectrón
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D16 Pollution / 001D16C Atmospheric pollution / 001D16C03 Analysis methods
- Discipline
- Pollution
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3905162
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0169-4332(93)90260-I 
https://dx.doi.org/10.1016/0169-4332(93)90260-I
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