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On the shape of umweg peaks

Author
ALEXANDROPOULOS, N. G; KOTSIS, K. T
Univ. Ioannina, dep. physics, 451 10 Ioannina, Greece
Source

Physica status solidi. A. Applied research. 1993, Vol 140, Num 2, pp 303-309 ; ref : 9 ref

CODEN
PSSABA
ISSN
0031-8965
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Wiley-VCH, Berlin
Publication country
Germany
Document type
Article
Language
English
Keyword (fr)
Diffraction RX Diffraction multiple Diffractométrie RX Etude expérimentale Rayon X Structure fine
Keyword (en)
X-ray diffraction Multiple diffraction X ray diffractometry Experimental study X radiation Fine structure
Keyword (es)
Difracción múltiple Difractometría RX
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques

Pacs
0785 X- and γ-ray instruments and techniques

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3971122

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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