Structures of clean and nickel-containing high Miller index surfaces of silicon
- Author
- OLSHANETSKY, B. Z; SOLOVYOV, A. E; DOLBAK, A. E; MASLOV, A. A
Russian acad. sci., inst. semiconductor physics, siberian branch, Novosibirsk 630090, Russian Federation - Source
Surface science. 1994, Vol 306, Num 3, pp 327-341 ; ref : 32 ref
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Netherlands
- Document type
- Article
- Language
- Russian
- Keyword (fr)
- AES Adsorbant minéral Adsorbat métallique Adsorption Diffraction électron lent Effet concentration Etude expérimentale Nickel Silicium Structure surface Transformation phase Ni Si Métal transition
- Keyword (en)
- AES Inorganic adsorbent Metallic adsorbate Adsorption LEED Quantity ratio Experimental study Nickel Silicon Surface structure Phase transformations Transition elements
- Keyword (es)
- Adsorbente inorgánico Adsorbato metálico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A14 Electron diffraction and scattering / 001B60A14H Low-energy electron diffraction (leed) and reflection high-energy electron diffraction (rheed)
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4074601
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0039-6028(94)90075-2 
https://dx.doi.org/10.1016/0039-6028(94)90075-2
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