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PIXE yield enhancement of metal fluorides under bombardment with charged particles

Author
PEISACH, M1 ; PINEDA, C. A; PILLAY, A. E1
[1] Univ. Witwatersrand, cent. applied chemistry, dep. chemistry, Wits 2050, South Africa
Source

Journal of radioanalytical and nuclear chemistry. 1994, Vol 178, Num 2, pp 387-397 ; ref : 10 ref

CODEN
JRNCDM
ISSN
0236-5731
Scientific domain
Analytical chemistry; Inorganic chemistry
Publisher
Springer, Dordrecht
Publication country
Netherlands
Document type
Article
Language
English
Keyword (fr)
Analyse PIXE Composé binaire Effet physique rayonnement Emission RX Etude expérimentale Faisceau ion Fluorure Rendement Spectre RX Composé minéral Métal Composé Métal transition composé
Keyword (en)
PIXE analysis Binary compounds Physical radiation effects X ray emission Experimental study Ion beams Fluorides Yields X-ray spectra Inorganic compounds Metals Compounds Transition element compounds
Keyword (es)
Emisión RX Compuesto
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I20 Impact phenomena (including electron spectra and sputtering) / 001B70I20R Atomic, molecular, and ion beam impact and interactions with surfaces

Pacs
7920R Atomic, molecular, and ion beam impact and interactions with surfaces

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
4182775

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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