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Surface composition and electronic structure of zeolites using X-ray photoelectron spectroscopy

Author
KAUSHIK, V. K1 ; BHAT, S. G. T1 ; CORBIN, D. R
[1] Indian Petrochemicals Corp. Ltd, res. cent., 391 346 Vadodara, India
Source

Zeolites. 1993, Vol 13, Num 8, pp 671-677 ; ref : 38 ref

CODEN
ZEOLD3
ISSN
0144-2449
Scientific domain
General chemistry, physical chemistry
Publisher
Butterworth Heinemann, Stoneham, MA
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Composition Energie liaison Etat électronique surface Etude expérimentale Rayon X Spectrométrie photoélectron Surface Tamis moléculaire Zéolite
Keyword (en)
Composition Binding energy Surface electron state Experimental study X radiation Photoelectron spectroscopy Surfaces Molecular sieves Zeolites
Keyword (es)
Composicion Estado electrónico superficie
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35D Composition; defects and impurities

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A45 Collective effects

Pacs
6835D Composition; defects and impurities

Pacs
7145 Collective effects

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
4195196

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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