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Substrates for high-Tc superconductor microwave integrated circuits

Author
HOLLMANN, E. K1 ; VENDIK, O. G1 ; ZAITSEV, A. G1 ; MELEKH, B. T
[1] Electrotech. univ., St. Petersburg 197376, Russian Federation
Source

Superconductor science & technology (Print). 1994, Vol 7, Num 9, pp 609-622 ; ref : 89 ref

ISSN
0953-2048
Scientific domain
Electronics; Condensed state physics
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
Russian
Keyword (fr)
Accommodation réseau Aluminium Oxyde Article synthèse Baryum oxyde Circuit intégré couche mince Cuivre oxyde Dilatation thermique Diélectrique Gallate Hyperfréquence Lanthanide Oxyde Magnésium Oxyde Perte diélectrique Préparation Saphir Stabilité Structure cristalline Support Supraconducteur haute température Yttrium oxyde Ba Cu O Y YBa2Cu3O7-x Composé minéral Lanthanide composé Métal transition composé
Keyword (en)
Mismatch lattice Aluminium Oxides Review Barium oxide Thin film circuit Copper oxide Thermal expansion Dielectric materials Gallates Microwave Lanthanide Oxides Magnesium Oxides Dielectric loss Preparation Sapphire Stability Crystalline structure Support High temperature superconductor Yttrium oxide Inorganic compound Lanthanide compound Transition element compounds
Keyword (es)
Acomodación red Aluminio Óxido Artículo síntesis Bario óxido Circuito integrado capa delgada Cobre óxido Dilatación térmica Dieléctrico Hiperfrecuencia Lantánido Óxido Magnesio Óxido Pérdida dieléctrica Preparación Zafiro Estabilidad Estructura cristalina Soporte Supraconductor alta temperatura Ytrio óxido Compuesto inorgánico Lantánido compuesto
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
4197263

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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