Optical studies of infrared active electronic defects in neutron irradiated silicon after annealing at 450°C
- Author
- SHI, Y1 ; WU, F. M1 ; ZHENG, Y. D1 ; SUEZAWA, M; IMAI, M; SUMINO, K
[1] Nanjing univ., dep. physics, Nanjing 210008, China - Source
Physica status solidi. A. Applied research. 1994, Vol 144, Num 1, pp 139-148 ; ref : 22 ref
- CODEN
- PSSABA
- ISSN
- 0031-8965
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Wiley-VCH, Berlin
- Publication country
- Germany
- Document type
- Article
- Language
- English
- Keyword (fr)
- Effet Hall Effet physique rayonnement Etat défaut Etude expérimentale Faisceau neutron Matériau semiconducteur Recuit Silicium Spectre IR Spectre absorption Si
- Keyword (en)
- Hall effect Physical radiation effects Defect states Experimental study Neutron beams Semiconductor materials Annealing Silicon Infrared spectra Absorption spectra
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A55 Impurity and defect levels / 001B70A55C Elemental semiconductors
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H20 Optical properties of bulk materials and thin films
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H30 Infrared and raman spectra and scattering / 001B70H30H Other nonmetallic inorganics
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4201354
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/pssa.2211440115 
https://dx.doi.org/10.1002/pssa.2211440115
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