Synchroton radiation study of structural properties of porous silicon
- Author
- BELLET, D1 ; DOLINO, G1 ; BILLAT, S1 ; LIGEON, M1 ; LEFEBVRE, S2 ; BESSIERE, M2
[1] CNRS Univ. Joseph Fourier, lab. spectrométrie physique, 38402 Saint-Martin-d'Hyères, France
[2] Lab. utilisation rayonnement synchroton, 91405 Orsay, France - Source
Journal of luminescence. 1994, Vol 62, Num 2, pp 49-54 ; ref : 17 ref
- CODEN
- JLUMA8
- ISSN
- 0022-2313
- Scientific domain
- Atomic molecular physics; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Diffusion en diffraction Etude expérimentale Matériau poreux Oxydation anodique Rayonnement synchrotron Semiconducteur type P Silicium Structure cristalline XRD Si
- Keyword (en)
- Diffuse scattering Experimental study Porous materials Anodization Synchrotron radiation P-type conductors Silicon Crystal structure XRD
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering / 001B60A10H X-ray absorption spectroscopy: exafs, nexafs, xanes, etc
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4248145
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0022-2313(94)90008-6 
https://dx.doi.org/10.1016/0022-2313(94)90008-6
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