Scanning tunnelling microscopy
- Author
- SHEN, J; PRITCHARD, R. G; THURSTANS, R. E
Univ. Glasgow, dep. electronics electrical eng., Glasgow G12 8QQ, United Kingdom - Source
Contemporary physics. 1991, Vol 32, Num 1, pp 11-20 ; ref : 11 ref
- Publisher
- Taylor & Francis, London
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Application Effet tunnel Microscopie tunnel balayage Méthode mesure Préparation Surface Echantillon
- Keyword (en)
- Application Tunnel effect Scanning tunneling microscopy Measurement method Preparation Surface
- Keyword (es)
- Aplicación Efecto túnel Microscopía túnel barrido Método medida Preparación Superficie
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4299868
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/00107519108213796 
https://dx.doi.org/10.1080/00107519108213796
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