Impurities in commercial-scale magnetic Czochralski silicon : axial versus transverse magnetic fields
- Author
- RAVISHANKAR, P. S; BRAGGINS, T. T; THOMAS, R. N
Westinghouse sci. technology cent., Pittsburgh PA 15235, United States - Source
Journal of crystal growth. 1990, Vol 104, Num 3, pp 617-628 ; ref : 21 ref
- CODEN
- JCRGAE
- ISSN
- 0022-0248
- Scientific domain
- Crystallography; Geology; Metallurgy, welding
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Champ magnétique Circuit intégré Concentration Convection naturelle Semiconducteur Siloxane polymère Viscosité magnétique
- Keyword (en)
- Magnetic field Integrated circuit Concentration Natural convection Semiconductor materials Siloxane polymer
- Keyword (es)
- Campo magnético Circuito integrado Concentración Convección natural Semiconductor(material) Siloxano polímero
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40A Electromagnetism; electron and ion optics / 001B40A90 Other topics in electromagnetism; electron and ion optics
- Discipline
- Physics : electromagnetism
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4386582
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0022-0248(90)90005-6 
https://dx.doi.org/10.1016/0022-0248(90)90005-6
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