Extended x-ray-absorption fine-structure determination of bond-length conservation at the clean InP(110) surface
- Author
- WOICIK, J. C1 ; KENDELEWICZ, T; MIYANO, K. E; RICHTER, M; BOULDIN, C. E; PIANETTA, P; SPICER, W. E
[1] National inst. standards technology, Gaithersburg MD 20899, United States - Source
Physical review. B, Condensed matter. 1992, Vol 46, Num 15, pp 9869-9872 ; ref : 14 ref
- CODEN
- PRBMDO
- ISSN
- 0163-1829
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- American Institute of Physics, Woodbury, NY
/
American Physical Society, Woodbury, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Etude expérimentale Face cristalline Indium Phosphure Longueur liaison Relaxation structurale Semiconducteur Spectrométrie Auger Spectrométrie EXAFS Surface Traitement surface Modèle rotation conservation longueur liaison Ordre moyenne distance
- Keyword (en)
- Inorganic compound Experimental study Crystal face Indium Phosphides Bond length Structure relaxation Semiconductor materials Auger electron spectrometry EXAFS spectrometry Surface Surface treatment
- Keyword (es)
- Compuesto inorgánico Estudio experimental Cara cristal Indio Fosfuro Longitud enlace Relajación estructural Semiconductor(material) Espectrometría Auger Espectrometría EXAFS Superficie Tratamiento superficie
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4393305
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevB.46.9869 
https://dx.doi.org/10.1103/PhysRevB.46.9869
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