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First-principles study of He in Si

Author
ALATALO, M1 ; PUSKA, M. J; NIEMINEN, R. M
[1] Univ. Helsinki, res. inst. theoretical physics, 00170 Helsinki, Finland
Source

Physical review. B, Condensed matter. 1992, Vol 46, Num 19, pp 12806-12809 ; ref : 21 ref

CODEN
PRBMDO
ISSN
0163-1829
Scientific domain
Crystallography; Metallurgy, welding; Condensed state physics
Publisher
American Institute of Physics, Woodbury, NY / American Physical Society, Woodbury, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Diffusion Energie totale Etude théorique Hélium Impureté interstitielle Lacune Méthode ab initio Méthode dynamique moléculaire Semiconducteur Silicium
Keyword (en)
Diffusion Total energy Theoretical study Helium Interstitial impurities Vacancy Ab initio method Molecular dynamics method Semiconductor materials Silicon
Keyword (es)
Difusión Energía total Estudio teórico Helio Impureza intersticial Cavidad Método ab initio Método dinámico molecular Semiconductor(material) Silicio
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60F Transport properties of condensed matter (nonelectronic) / 001B60F30 Diffusion in solids / 001B60F30J Diffusion of impurities

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
4472321

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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