Fluctuations and critical scaling in type-I intermittency
- Author
- REIN, A; HÜPPER, G; SCHÖLL, E
Tech. Univ., inst. Theoretische Physik, 1000 Berlin, Germany - Source
Europhysics letters (Print). 1993, Vol 21, Num 1, pp 7-12 ; ref : 12 ref
- CODEN
- EULEEJ
- ISSN
- 0295-5075
- Scientific domain
- Optics; Atomic molecular physics; Condensed state physics; Physics
- Publisher
- EDP sciences, Les Ulis
- Publication country
- France
- Document type
- Article
- Language
- English
- Keyword (fr)
- Chaos Comportement critique Effet Hall Intermittence Loi échelle Semiconducteur Simulation numérique Théorème fluctuation dissipation Application logistique Diagramme bifurcation
- Keyword (en)
- Chaos Critical behavior Hall effect Intermittency Scaling law Semiconductor materials Numerical simulation Fluctuation dissipation theorem Logistic map Bifurcation diagram
- Keyword (es)
- Caos Comportamiento crítico Efecto Hall Intermitencia Ley escala Semiconductor(material) Simulación numérica Teorema fluctuación disipación
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00E Statistical physics, thermodynamics, and nonlinear dynamical systems / 001B00E45 Nonlinear dynamics and nonlinear dynamical systems
- Discipline
- Theoretical physics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4499376
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1209/0295-5075/21/1/002 
https://dx.doi.org/10.1209/0295-5075/21/1/002
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