Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
- Author
- COENE, W1 ; JANSSEN, G1 ; OP DE BEECK, M; VAN DYCK, D
[1] Philips Research Laboratories, 5600 JA Eindhoven, Netherlands - Source
Physical review letters. 1992, Vol 69, Num 26, pp 3743-3746 ; ref : 18 ref
- CODEN
- PRLTAO
- ISSN
- 0031-9007
- Scientific domain
- Optics; Atomic molecular physics; Condensed state physics; Physics; Plasma physics
- Publisher
- American Physical Society, Ridge, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Haute résolution Microscope électronique Microscopie électronique transmission Traitement image
- Keyword (en)
- High resolution Electron microscope Transmission electron microscopy Image processing
- Keyword (es)
- Alta resolucion Microscopio electrónico Microscopía electrónica transmisión Procesamiento imagen
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4581255
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevLett.69.3743 
https://dx.doi.org/10.1103/PhysRevLett.69.3743
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