On the correlation between electron mobility, free-ion yield, and electron thermalization distance in nonpolar dielectric liquids
- Autor
- JAY-GERIN, J.-P1 ; GOULET, T1 ; BILLARD, I2
[1] Univ. Sherbrooke, dép. médecine nucléaire radiobiologie, groupe conseil rech. médicales Canada sci. radiations, Sherbrooke PQ J1H 5N4, Canada
[2] Cent. rech. nucléaires, lab. chimie nucléaire, 67037 Strasbourg, France - Fuente
Canadian journal of chemistry (Print). = Journal canadien de chimie. 1993, Vol 71, Num 3, pp 287-293 ; ref : 66 ref
- CODEN
- CJCHAG
- ISSN
- 0008-4042
- Campo Científico
- Chemistry; Crystallography; Atomic molecular physics
- Editor
- National Research Council of Canada, Ottawa, ON
- País de la publicación
- Canada
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Constante diélectrique Diélectrique Etat liquide Mobilité porteur charge Thermalisation Liquide non polaire
- Palabra clave (in)
- Permittivity Dielectric materials Liquid state Charge carrier mobility Thermalization
- Palabra clave (es)
- Constante dieléctrica Dieléctrico Estado líquido Movilidad portador carga Termalización
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70B Electronic transport in condensed matter / 001B70B80 Conductivity of specific materials
- Disciplina
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 4804213
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1139/v93-042 
https://dx.doi.org/10.1139/v93-042
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