Photoemission and low-energy-electron-diffraction study of clean and oxygen-dosed Cu2O (111) and (100) surfaces
- Author
- SCHULZ, K. H; COX, D. F
State univ., Virginia polytech. inst., dep. chemical eng., Blacksburg VA 24061, United States - Source
Physical review. B, Condensed matter. 1991, Vol 43, Num 2, pp 1610-1621 ; ref : 36 ref
- CODEN
- PRBMDO
- ISSN
- 0163-1829
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- American Institute of Physics, Woodbury, NY
/
American Physical Society, Woodbury, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Cuivre Oxyde Diffraction électron lent Défaut Etude expérimentale Ion Irradiation Modèle structure Rayon X Reconstruction surface Relaxation structurale Spectrométrie photoélectron Structure adsorption Structure électronique Surface Traitement surface Traitement thermique
- Keyword (en)
- Inorganic compound Copper Oxides LEED diffraction Defect Experimental study Ions Irradiation Structural model X ray Surface reconstruction Structure relaxation Photoelectron spectrometry Adsorption structure Electronic structure Surface Surface treatment Heat treatment
- Keyword (es)
- Compuesto inorgánico Cobre Óxido Difracción electrón lenta Defecto Estudio experimental Ión Irradiación Modelo estructura Rayos X Reconstrucción superficie Relajación estructural Espectrometría fotoelectrón Estructura adsorción Estructura electrónica Superficie Tratamiento superficie Tratamiento térmico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4942214
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1103/PhysRevB.43.1610 
https://dx.doi.org/10.1103/PhysRevB.43.1610
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