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An atomicity-constrained least-squares phase-refinement method

Author
RIUS, J; MIRAVITTLES, C
CSIC, inst. ciènc. materials, Cerdanyola Barcelona 08193, Spain
Source

Acta crystallographica. Section A, Foundations of crystallography. 1991, Vol 47, pp 567-571 ; 5 ; ref : 15 ref

CODEN
ACACEQ
ISSN
0108-7673
Scientific domain
Crystallography
Publisher
Blackwell, Oxford
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Affinement Diffraction RX Etude théorique Facteur structure Fonction Patterson Formule tangente Méthode moindre carré Phase amplitude Résolution structurale
Keyword (en)
Refinement X ray diffraction Theoretical study Structure factor Patterson function Tangent formula Least squares method Amplitude phase Structure resolution
Keyword (es)
Afinamiento Difracción RX Estudio teórico Factor estructura Función Patterson Fórmula tangente Método cuadrado menor Fase amplitud Resolución estructural
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A10 X-ray diffraction and scattering

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
4946499

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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