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Optical and microstructural properties of hafnium dioxide thin films

Author
LEHAN, J. P; MAO, Y; BOVARD, B. G; MACLEOD, H. A
Univ. Arizona, optical sci. cent., Tucson AZ 85721, United States
Source

Thin solid films. 1991, Vol 203, Num 2, pp 227-250 ; ref : 44 ref

CODEN
THSFAP
ISSN
0040-6090
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Elsevier Science, Lausanne
Publication country
Switzerland
Document type
Article
Language
English
Keyword (fr)
Composé minéral Couche mince Diffraction électron Etude expérimentale Hafnium Oxyde Indice réfraction Microscopie électronique balayage Microscopie électronique transmission Microstructure Propriété optique Rétrodiffusion Rutherford Spectrométrie photoélectron
Keyword (en)
Inorganic compound Thin film Electron diffraction Experimental study Hafnium Oxides Refraction index Scanning electron microscopy Transmission electron microscopy Microstructure Optical properties Rutherford backscattering Photoelectron spectrometry
Keyword (es)
Compuesto inorgánico Capa fina Difracción electrónica Estudio experimental Hafnio Óxido Indice refracción Microscopía electrónica barrido Microscopía electrónica transmisión Microestructura Propiedad óptica Retrodifusión Rutherford Espectrometría fotoelectrón
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
4980335

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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