Simulation and modeling of the low-frequency base resistance of bipolar transistors and its dependence on current and geometry
- Author
- SCHRÖTER, M
Ruhr-univ. Bochum, Bochum 4630, Germany - Source
I.E.E.E. transactions on electron devices. 1991, Vol 38, Num 3, pp 538-544 ; ref : 15 ref
- CODEN
- IETDAI
- ISSN
- 0018-9383
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Autoalignement Base transistor Basse fréquence Configuration géométrique Equipotentielle Modélisation Polycristal Résistivité électrique Simulation ordinateur Technologie grille silicium Transistor bipolaire
- Keyword (en)
- Self alignment Transistor base Low frequency Geometrical configuration Equipotential Modeling Polycrystal Electric resistivity Computer simulation Silicon gate technology Bipolar transistor
- Keyword (es)
- Autoalineación Base transistor Baja frecuencia Configuración geométrica Equipotencial Modelización Policristal Resistividad eléctrica Simulación computadora Tecnología rejilla silicio
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F04 Transistors
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4981976
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/16.75164 
https://dx.doi.org/10.1109/16.75164
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