A treatment of dynamical diffraction for multiply layered structures
- Author
- ROSSOUW, C. J; AL-KHAFAJI, M; CHERNS, D; STEEDS, J. W; TOUAITIA, R
Univ. Bristol, H.H. Wills physics lab., Bristol Avon BS8 1TL, United Kingdom - Source
Ultramicroscopy. 1991, Vol 35, Num 3-4, pp 229-236 ; ref : 25 ref
- CODEN
- ULTRD6
- ISSN
- 0304-3991
- Scientific domain
- Cell biology, histology; Crystallography; Physics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Aluminium Couche mince Couche multiple Diagramme rotation Diffraction électron Etude théorique Gallium Arséniure Gallium Indium Arséniure Mixte Indium Phosphure Interface solide solide Méthode faisceau convergent Onde Bloch Puits quantique multiple Semiconducteur Silicium Simulation ordinateur Système binaire Système germanium silicium Métal Non métal
- Keyword (en)
- Aluminium Thin film Multiple layer Rocking curve Electron diffraction Theoretical study Gallium Arsenides Gallium Indium Arsenides Mixed Indium Phosphides Solid solid interface Convergent beam method Bloch wave Multiple quantum well Semiconductor materials Silicon Computer simulation Binary system Metal Non metal
- Keyword (es)
- Aluminio Capa fina Capa múltiple Diagrama rotación Difracción electrónica Estudio teórico Galio Arseniuro Galio Indio Arseniuro Mixto Indio Fosfuro Interfase sólido sólido Método haz convergente Onda Bloch Pozo cuántico múltiple Semiconductor(material) Silicio Simulación computadora Sistema binario Metal No metal
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A14 Electron diffraction and scattering
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 4987912
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0304-3991(91)90074-G 
https://dx.doi.org/10.1016/0304-3991(91)90074-G
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:28:\"10.1016\/0304-3991(91)90074-G\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:68:\"A treatment of dynamical diffraction for multiply layered structures\";s:9:\"\u0000*\u0000jtitle\";s:15:\"Ultramicroscopy\";s:9:\"\u0000*\u0000stitle\";s:15:\"Ultramicroscopy\";s:7:\"\u0000*\u0000date\";s:4:\"1991\";s:9:\"\u0000*\u0000volume\";s:2:\"35\";s:8:\"\u0000*\u0000issue\";s:3:\"3-4\";s:8:\"\u0000*\u0000spage\";s:3:\"229\";s:8:\"\u0000*\u0000epage\";s:3:\"236\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0304-3991\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"ROSSOUW\";s:10:\"\u0000*\u0000aufirst\";s:4:\"C. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:4:{i:0;s:13:\"AL-KHAFAJI, M\";i:1;s:9:\"CHERNS, D\";i:2;s:12:\"STEEDS, J. W\";i:3;s:11:\"TOUAITIA, R\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ULTRD6\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:68:\"A treatment of dynamical diffraction for multiply layered structures\";s:8:\"\u0000*\u0000place\";s:9:\"Amsterdam\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:28:\"10.1016\/0304-3991(91)90074-G\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:68:\"A treatment of dynamical diffraction for multiply layered structures\";s:9:\"\u0000*\u0000jtitle\";s:15:\"Ultramicroscopy\";s:9:\"\u0000*\u0000stitle\";s:15:\"Ultramicroscopy\";s:7:\"\u0000*\u0000date\";s:4:\"1991\";s:9:\"\u0000*\u0000volume\";s:2:\"35\";s:8:\"\u0000*\u0000issue\";s:3:\"3-4\";s:8:\"\u0000*\u0000spage\";s:3:\"229\";s:8:\"\u0000*\u0000epage\";s:3:\"236\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0304-3991\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"ROSSOUW\";s:10:\"\u0000*\u0000aufirst\";s:4:\"C. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:4:{i:0;s:13:\"AL-KHAFAJI, M\";i:1;s:9:\"CHERNS, D\";i:2;s:12:\"STEEDS, J. W\";i:3;s:11:\"TOUAITIA, R\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ULTRD6\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:68:\"A treatment of dynamical diffraction for multiply layered structures\";s:8:\"\u0000*\u0000place\";s:9:\"Amsterdam\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"UnpaywallOpenUrl\":35:{s:8:\"\u0000*\u0000email\";s:27:\"assistance-portail@inist.fr\";s:6:\"\u0000*\u0000fmt\";N;s:6:\"\u0000*\u0000doi\";s:28:\"10.1016\/0304-3991(91)90074-G\";s:6:\"\u0000*\u0000pii\";N;s:7:\"\u0000*\u0000pmid\";N;s:9:\"\u0000*\u0000atitle\";N;s:9:\"\u0000*\u0000jtitle\";N;s:9:\"\u0000*\u0000stitle\";N;s:7:\"\u0000*\u0000date\";N;s:9:\"\u0000*\u0000volume\";N;s:8:\"\u0000*\u0000issue\";N;s:8:\"\u0000*\u0000spage\";N;s:8:\"\u0000*\u0000epage\";N;s:8:\"\u0000*\u0000pages\";N;s:7:\"\u0000*\u0000issn\";N;s:8:\"\u0000*\u0000eissn\";N;s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";N;s:9:\"\u0000*\u0000aucorp\";N;s:7:\"\u0000*\u0000isbn\";N;s:8:\"\u0000*\u0000coden\";N;s:8:\"\u0000*\u0000genre\";N;s:7:\"\u0000*\u0000part\";N;s:9:\"\u0000*\u0000btitle\";N;s:8:\"\u0000*\u0000title\";N;s:8:\"\u0000*\u0000place\";N;s:6:\"\u0000*\u0000pub\";N;s:10:\"\u0000*\u0000edition\";N;s:9:\"\u0000*\u0000tpages\";N;s:9:\"\u0000*\u0000series\";N;s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";N;}"
Unpaywall access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:28:\"10.1016\/0304-3991(91)90074-G\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:68:\"A treatment of dynamical diffraction for multiply layered structures\";s:9:\"\u0000*\u0000jtitle\";s:15:\"Ultramicroscopy\";s:9:\"\u0000*\u0000stitle\";s:15:\"Ultramicroscopy\";s:7:\"\u0000*\u0000date\";s:4:\"1991\";s:9:\"\u0000*\u0000volume\";s:2:\"35\";s:8:\"\u0000*\u0000issue\";s:3:\"3-4\";s:8:\"\u0000*\u0000spage\";s:3:\"229\";s:8:\"\u0000*\u0000epage\";s:3:\"236\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0304-3991\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"ROSSOUW\";s:10:\"\u0000*\u0000aufirst\";s:4:\"C. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:4:{i:0;s:13:\"AL-KHAFAJI, M\";i:1;s:9:\"CHERNS, D\";i:2;s:12:\"STEEDS, J. W\";i:3;s:11:\"TOUAITIA, R\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ULTRD6\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:68:\"A treatment of dynamical diffraction for multiply layered structures\";s:8:\"\u0000*\u0000place\";s:9:\"Amsterdam\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:28:\"10.1016\/0304-3991(91)90074-G\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:68:\"A treatment of dynamical diffraction for multiply layered structures\";s:9:\"\u0000*\u0000jtitle\";s:15:\"Ultramicroscopy\";s:9:\"\u0000*\u0000stitle\";s:15:\"Ultramicroscopy\";s:7:\"\u0000*\u0000date\";s:4:\"1991\";s:9:\"\u0000*\u0000volume\";s:2:\"35\";s:8:\"\u0000*\u0000issue\";s:3:\"3-4\";s:8:\"\u0000*\u0000spage\";s:3:\"229\";s:8:\"\u0000*\u0000epage\";s:3:\"236\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0304-3991\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"ROSSOUW\";s:10:\"\u0000*\u0000aufirst\";s:4:\"C. J\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:4:{i:0;s:13:\"AL-KHAFAJI, M\";i:1;s:9:\"CHERNS, D\";i:2;s:12:\"STEEDS, J. W\";i:3;s:11:\"TOUAITIA, R\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ULTRD6\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:0:\"\";s:8:\"\u0000*\u0000title\";s:68:\"A treatment of dynamical diffraction for multiply layered structures\";s:8:\"\u0000*\u0000place\";s:9:\"Amsterdam\";s:6:\"\u0000*\u0000pub\";s:16:\"Elsevier Science\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
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