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Polish-induced surface damage in nickel : scanning acoustic microscopy and Brillouin scattering study

Author
SATHISH, S; MENDIK, M; KULIK, A; GREMAUD, G; WACHTER, P
Inst. génie atomique, Ecublens 1015, Switzerland
Source

Applied physics letters. 1991, Vol 59, Num 2, pp 167-168 ; ref : 14 ref

CODEN
APPLAB
ISSN
0003-6951
Scientific domain
Crystallography; Electronics; Optics; Condensed state physics
Publisher
American Institute of Physics, Melville, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Constante élasticité Diffusion Brillouin Défaut Etude expérimentale Métal transition Nickel Onde acoustique Onde surface Surface Microscopie acoustique balayage
Keyword (en)
Elastic constant Brillouin effect Defect Experimental study Transition metal Nickel Acoustic wave Surface wave Surface Scanning acoustic microscopy
Keyword (es)
Constante elasticidad Difusión Brillouin Defecto Estudio experimental Metal transición Niquel Onda acústica Onda superficie Superficie
Keyword (de)
Elastizitaetskonstante Fehler Experimentelle Untersuchung Uebergangsmetalle Nickel Akustische Welle Oberflaechenwelle Oberflaeche
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35B Surface structure and topography

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy

Discipline
Metals. Metallurgy Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
4996416

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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