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Alkali metal intercalation into SnS2 : UHV investigations of (0001) surfaces

Author
BRONOLD, M; PETTENKOFER, C; JAEGERMANN, W
Hahn-Meitner-Inst., Berlin 1000, Germany
Source

Applied physics. A, Solids and surfaces. 1991, Vol 52, Num 3, pp 171-179 ; ref : 51 ref

CODEN
APSFDB
ISSN
0721-7250
Scientific domain
Electronics; Condensed state physics
Publisher
Springer, Berlin / Springer, Heidelberg / Springer, New York, NY
Publication country
Germany
Document type
Article
Language
English
Keyword (fr)
Cinétique Composé insertion Diffraction électron lent Défaut Etain Sulfure Etude expérimentale Interaction Métal alcalin Potassium Rayon X Sodium Spectrométrie photoélectron Stoechiométrie Structure électronique Diffusion ion Mécanisme réaction insertion
Keyword (en)
Kinetics Intercalation compound LEED diffraction Defect Tin Sulfides Experimental study Interaction Alkali metal Potassium X ray Sodium Photoelectron spectrometry Stoichiometry Electronic structure
Keyword (es)
Cinética Compuesto inserción Difracción electrón lenta Defecto Estaño Sulfuro Estudio experimental Interacción Metal alcalino Potasio Rayos X Sodio Espectrometría fotoelectrón Estequiométría Estructura electrónica
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5037344

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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