Photoemission from thick overlying epitaxial layers of CaF2 on Si(111)
- Author
- QUINIOU, B1 ; SCHWARZ, W; WU, Z; OSGOOD, R. M; YANG, Q; PHILLIPS, J. M
[1] Columbia univ., Columbia radiation lab., New York NY 10027, United States - Source
Applied physics letters. 1992, Vol 60, Num 2, pp 183-185 ; ref : 19 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Calcium Fluorure Composé minéral Couche mince Couche épitaxique Emission photoélectronique Epaisseur Etude expérimentale Rayonnement UV Support Si
- Keyword (en)
- Calcium Fluorides Inorganic compound Thin film Epitaxial film Photoelectron emission Thickness Experimental study Ultraviolet radiation
- Keyword (es)
- Calcio Fluoruro Compuesto inorgánico Capa fina Capa epitáxica Emisión fotoelectrónica Espesor Estudio experimental Radiación ultravioleta
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I60 Photoemission and photoelectron spectra
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5050512
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.106957 
https://dx.doi.org/10.1063/1.106957
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