Acceleration of relaxation-based circuit simulation using a multiprocessor system
- Author
- ODENT, P; CLAESEN, L. J. M; DE MAN, H
IMEC, VSDM div., Leuven 3030, Belgium - Source
IEEE transactions on computer-aided design of integrated circuits and systems. 1990, Vol 9, Num 10, pp 1063-1072 ; ref : 28 ref
- CODEN
- ITCSDI
- ISSN
- 0278-0070
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Algorithme Amélioration Boucle réaction Circuit VLSI Conception circuit Essai Etude expérimentale Etude théorique Mémoire Performance Processeur Simulateur Simulation ordinateur Technologie MOS Tension électrique Transistor
- Keyword (en)
- Algorithm Improvement Feedback VLSI circuit Circuit design Test Experimental study Theoretical study Memory Performance Processor Simulator Computer simulation MOS technology Voltage Transistor
- Keyword (es)
- Algoritmo Mejoría Retroalimentación Circuito VLSI Concepción circuito Ensayo Estudio experimental Estudio teórico Memoria Rendimiento Procesador Simulador Simulación computadora Tecnología MOS Voltaje Transistor
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5069042
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/43.62732 
https://dx.doi.org/10.1109/43.62732
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