Effect of ion and neutral sputtering on single crystal TiO2
- Author
- SULLIVAN, J. L1 ; SAIED, S. O; BERTOTI, I
[1] Univ. Aston, dep. electrical applied physics, Birmingham, West Midlands B4 7ET, United Kingdom - Source
Vacuum. 1991, Vol 42, Num 18, pp 1203-1208 ; ref : 16 ref
- CODEN
- VACUAV
- ISSN
- 0042-207X
- Scientific domain
- Metallurgy, welding; Physics
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Etude expérimentale Faisceau atomique Faisceau ionique Irradiation Rayon X Réduction chimique Spectrométrie photoélectron Surface Temps exposition Titane Oxyde Azote Ion atomique Hélium Ion atomique Métal transition Composé
- Keyword (en)
- Inorganic compound Experimental study Atomic beam Ion beam Irradiation X ray Chemical reduction Photoelectron spectrometry Surface Exposure time Titanium Oxides Nitrogen Atomic ions Helium Atomic ions Transition metal Compounds
- Keyword (es)
- Compuesto inorgánico Estudio experimental Haz atómico Haz iónico Irradiación Rayos X Reducción química Espectrometría fotoelectrón Superficie Tiempo exposición Titanio Óxido Nitrógeno Ión atómico Helio Ión atómico Metal transición Compuesto
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A80 Physical radiation effects, radiation damage / 001B60A80L Atom and molecule irradiation effects
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5110624
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0042-207X(91)90131-2 
https://dx.doi.org/10.1016/0042-207X(91)90131-2
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