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En Japonais

Other title
Quantitative analysis of tungsten silicide film and borophosphosilicate glass film deposited on a silicon wafer using electron probe microanalysis (en)
Author
MAKIISHI, N; YAMAMOTO, A; OKANO, T; MATSUMURA, Y
Kawasaki Steel Corp., tech. res. div., analysis material sci. res. cent., Chiba-shi Chiba 260, Japan
Source

Bunseki Kagaku. 1991, Vol 40, Num 11, pp T195-T202 ; ref : 17 ref

CODEN
BNSKAK
ISSN
0525-1931
Scientific domain
Analytical chemistry
Publisher
Nippon Bunseki Kagakkai, Tokyo
Publication country
Japan
Document type
Article
Language
Japanese
Keyword (fr)
Analyse chimique Couche mince Microanalyse Microsonde Sonde électronique Spectrométrie RX Tungstène Siliciure Verre Borophosphosilicate
Keyword (en)
Chemical analysis Thin film Microanalysis Microprobe Electron probe X ray spectrometry Tungsten Silicides Glass
Keyword (es)
Análisis químico Capa fina Microanálisis Microsonda Sonda electrónica Espectrometría RX Wolframio Siliciuro Vidrio
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods

Discipline
Analytical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5164047

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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