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http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=5164049

En Japonais

Other title
Surface analysis of 80 K-phase Bi2Sr2CaCu2Oy superconducting single crystals and thin films by X-ray photoelectron spectroscopy (en)
Author
KISHIDA, S; TOKUTAKA, H; NISHIMORI, K
Tottori univ., dep. electrical electronic eng., Tottori-shi Tottori 680, Japan
Source

Bunseki Kagaku. 1991, Vol 40, Num 11, pp 823-827 ; ref : 15 ref

CODEN
BNSKAK
ISSN
0525-1931
Scientific domain
Analytical chemistry
Publisher
Nippon Bunseki Kagakkai, Tokyo
Publication country
Japan
Document type
Article
Language
Japanese
Keyword (fr)
Analyse chimique Analyse surface Bismuth Calcium Cuivre Strontium Oxyde Mixte Couche mince Rayon X Spectrométrie photoélectron Supraconducteur haute température
Keyword (en)
Chemical analysis Surface analysis Bismuth Calcium Copper Strontium Oxides Mixed Thin film X ray Photoelectron spectrometry High temperature superconductor
Keyword (es)
Análisis químico Análisis superficie Bismuto Calcio Cobre Estroncio Óxido Mixto Capa fina Rayos X Espectrometría fotoelectrón Supraconductor alta temperatura
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods

Discipline
Analytical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5164049

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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