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En Japonais

Other title
X-ray photoelectron spectroscopic measurement and chemical characteristics of silica, alumina and silica-alumina (en)
Author
AYAME, A; KITAGAWA, T
Muroran inst. technology, dep. applied chemistry, Muroran-shi Hokkaido 050, Japan
Source

Bunseki Kagaku. 1991, Vol 40, Num 11, pp 673-678 ; ref : 9 ref

CODEN
BNSKAK
ISSN
0525-1931
Scientific domain
Analytical chemistry
Publisher
Nippon Bunseki Kagakkai, Tokyo
Publication country
Japan
Document type
Article
Language
Japanese
Keyword (fr)
Aluminium Oxyde Analyse chimique Propriété chimique Rayon X Silicium Oxyde Spectrométrie photoélectron
Keyword (en)
Aluminium Oxides Chemical analysis Chemical properties X ray Silicon Oxides Photoelectron spectrometry
Keyword (es)
Aluminio Óxido Análisis químico Propiedad química Rayos X Silicio Óxido Espectrometría fotoelectrón
Classification
Pascal
001 Exact sciences and technology / 001C Chemistry / 001C04 Analytical chemistry / 001C04C Spectrometric and optical methods

Discipline
Analytical chemistry
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5164058

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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