A quantitative technique to analyze materials trade-off for SEM E
- Author
- NG, L. H; FIELD, F. R
IBIS Associates Inc., Wellesley MA 02181, United States - Source
IEEE transactions on components, hybrids, and manufacturing technology. 1992, Vol 15, Num 1, pp 78-86 ; ref : 14 ref
- CODEN
- ITTEDR
- ISSN
- 0148-6411
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse quantitative Aspect économique Etude méthode Performance Module électronique standard
- Keyword (en)
- Quantitative analysis Economic aspect Method study Performance
- Keyword (es)
- Análisis cuantitativo Aspecto económico Estudio método Rendimiento
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03C Materials
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5165116
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/33.124195 
https://dx.doi.org/10.1109/33.124195
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