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Optical end point detection of etched YBCO films

Author
DOLATA, R; FISCHER, M; JUTZI, W
Univ. Karlsruhe, Inst. Electrotech. Grundlagen Informatik, Karlsruhe 7500, Germany
Source

Physica. C. Superconductivity. 1992, Vol 191, Num 3-4, pp 525-529 ; ref : 10 ref

ISSN
0921-4534
Scientific domain
Crystallography; Electronics; Electrical engineering; Condensed state physics
Publisher
Elsevier Science, Amsterdam
Publication country
Netherlands
Document type
Article
Language
English
Keyword (fr)
Baryum Cuivre Yttrium Oxyde Mixte Composé minéral Couche mince Epaisseur Etude expérimentale Faisceau laser Irradiation Métal transition Composé Propriété optique Réflexion optique Simulation ordinateur Support Traitement surface
Keyword (en)
Barium Copper Yttrium Oxides Mixed Inorganic compound Thin film Thickness Experimental study Laser beam Irradiation Transition metal Compounds Optical properties Optical reflection Computer simulation Support Surface treatment
Keyword (es)
Bario Cobre Ytrio Óxido Mixto Compuesto inorgánico Capa fina Espesor Estudio experimental Haz láser Irradiación Metal transición Compuesto Propiedad óptica Reflexión óptica Simulación computadora Soporte Tratamiento superficie
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35J Surface and interface dynamics and vibrations

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5167404

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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