Photoreflectance study of photovoltage effects in GaAs diode structures
- Author
- AIRAKSINEN, V. L; LIPSANEN, H. K
Electron physics lab., 02150 Espoo, Finland - Source
Applied physics letters. 1992, Vol 60, Num 17, pp 2110-2112 ; ref : 9 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Basse température Champ électrique Composé minéral Diode Effet Franz Keldysh Etude expérimentale Gallium Arséniure Haute température Réflexion optique Semiconducteur Température
- Keyword (en)
- Low temperature Electric field Inorganic compound Diode Franz Keldysh effect Experimental study Gallium Arsenides High temperature Optical reflection Semiconductor materials Temperature
- Keyword (es)
- Baja temperatura Campo eléctrico Compuesto inorgánico Diodo Efecto Franz Keldysh Estudio experimental Galio Arseniuro Alta temperatura Reflexión óptica Semiconductor(material) Temperatura
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5250844
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.107105 
https://dx.doi.org/10.1063/1.107105
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