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En Japonais

Other title
X-ray photoelectron spectroscopic study of impurities among high-temperature superconductive oxide B2Sr2Can-1CunOy (n=1, 2) (en)
Author
OKU, M; SHISHIDO, T; FUKUDA, T; HIROKAWA, K
Tohoku univ., inst. materials res., Aoba-ku Sendai-shi Miyagi 980, Japan
Source

Bunseki Kagaku. 1991, Vol 40, Num 11, pp 735-740 ; ref : 15 ref

CODEN
BNSKAK
ISSN
0525-1931
Scientific domain
Analytical chemistry
Publisher
Nippon Bunseki Kagakkai, Tokyo
Publication country
Japan
Document type
Article
Language
Japanese
Keyword (fr)
Attaque chimique Bismuth Calcium Cuivre Strontium Oxyde Mixte Composé minéral Etude expérimentale Impureté Polyèdre coordination Rayon X Spectrométrie photoélectron Supraconducteur haute température Métal transition Composé
Keyword (en)
Chemical etching Bismuth Calcium Copper Strontium Oxides Mixed Inorganic compound Experimental study Impurity Coordination polyhedron X ray Photoelectron spectrometry High temperature superconductor Transition metal Compounds
Keyword (es)
Ataque químico Bismuto Calcio Cobre Estroncio Óxido Mixto Compuesto inorgánico Estudio experimental Impureza Poliedro coordinación Rayos X Espectrometría fotoelectrón Supraconductor alta temperatura Metal transición Compuesto
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A66 Structure of specific crystalline solids / 001B60A66F Inorganic compounds / 001B60A66F1 Water, oxides, hydroxides, peroxides

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5274738

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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