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Piezo-optical response of Ge in the visible-uv-range

Author
ETCHEGOIN, P; KIRCHER, J; CARDONA, M; GREIN, C
Max-Planck-Inst. Festkörperforschung, 7000 Stuttgart, Germany
Source

Physical review. B, Condensed matter. 1992, Vol 45, Num 20, pp 11721-11735 ; ref : 54 ref

CODEN
PRBMDO
ISSN
0163-1829
Scientific domain
Crystallography; Metallurgy, welding; Condensed state physics
Publisher
American Institute of Physics, Woodbury, NY / American Physical Society, Woodbury, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Contrainte uniaxiale Effet piézooptique Ellipsométrie Etude expérimentale Fonction diélectrique Germanium Méthode pseudopotentiel Rayonnement UV Rayonnement visible Semiconducteur
Keyword (en)
Uniaxial stress Piezooptical effect Ellipsometry Experimental study Dielectric function Germanium Pseudopotential method Ultraviolet radiation Visible radiation Semiconductor materials
Keyword (es)
Tensión uniaxial Efecto piezoóptico Elipsometría Estudio experimental Función dieléctrica Germanio Método seudopotencial Radiación ultravioleta Radiacion invisible Semiconductor(material)
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H20 Optical properties of bulk materials and thin films / 001B70H20H Piezo-, elasto-, acoustooptical, and photoacoustic effects

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5332763

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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