A novel critical path heuristic for fast fault grading
- Author
- FAVALLI, M; OLIVO, P; RICCO, B
Univ. Bologna, DEIS, Bologna 40136, Italy - Source
IEEE transactions on computer-aided design of integrated circuits and systems. 1991, Vol 10, Num 4, pp 545-548 ; ref : 8 ref
- CODEN
- ITCSDI
- ISSN
- 0278-0070
- Scientific domain
- Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Algorithme Chemin critique Circuit VLSI Circuit logique Détection défaut Fiabilité Méthode heuristique Simulation ordinateur
- Keyword (en)
- Algorithm Critical path VLSI circuit Logic circuit Defect detection Reliability Heuristic method Computer simulation
- Keyword (es)
- Algoritmo Recorrido crítico Circuito VLSI Circuito lógico Detección imperfección Fiabilidad Método heurístico Simulación computadora
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5343887
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/43.75639 
https://dx.doi.org/10.1109/43.75639
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