A tunneling instrument for angle resolved tunneling spectroscopy
- Author
- SUZUKU, M1 ; FUJII, T; MIYASHITA, M; ONUKI, T; ENOMOTO, H; OZAKI, H
[1] Nikon Corp., Shinagawa, Tokyo 140, Japan - Source
Review of scientific instruments. 1991, Vol 62, Num 10, pp 2424-2426 ; ref : 6 ref
- CODEN
- RSINAK
- ISSN
- 0034-6748
- Scientific domain
- Electronics; Physics
- Publisher
- American Institute of Physics, Woodbury, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Angle Anisotropie Inclinaison Microscopie tunnel balayage Rotation Spectrométrie tunnel Surface Fermi
- Keyword (en)
- Angle Anisotropy Tilt Scanning tunneling microscopy Rotation Tunneling spectrometry Fermi surface
- Keyword (es)
- Angulo Anisotropía Inclinación Microscopía túnel barrido Rotación Espectrometría túnel Superficie Fermi
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G90 Other topics in instruments, apparatus, components and techniques common to several branches of physics and astronomy
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5421688
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.1142524 
https://dx.doi.org/10.1063/1.1142524
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