Oxidation effects on cleaved multiple quantum well surfaces in air observed by scanning probe microscopy
- Author
- HOWELLS, S; GALLAGHER, M. J; CHEN, T; PAX, P; SARID, D
Univ. Arizona, optical sci. cent., Tucson AZ 85721, United States - Source
Applied physics letters. 1992, Vol 61, Num 7, pp 801-803 ; ref : 7 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Composé minéral Couche mince Etude expérimentale Gallium Indium Arséniure Mixte Indium Phosphure Microscopie force atomique Microscopie tunnel balayage Oxydation Puits quantique multiple Semiconducteur Surface
- Keyword (en)
- Inorganic compound Thin film Experimental study Gallium Indium Arsenides Mixed Indium Phosphides Atomic force microscopy Scanning tunneling microscopy Oxidation Multiple quantum well Semiconductor materials Surface
- Keyword (es)
- Compuesto inorgánico Capa fina Estudio experimental Galio Indio Arseniuro Mixto Indio Fosfuro Microscopía fuerza atómica Microscopía túnel barrido Oxidación Pozo cuántico múltiple Semiconductor(material) Superficie
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H65 Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5461673
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.107806 
https://dx.doi.org/10.1063/1.107806
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