A tanh subsitution technique for the analysis of abrupt and graded interface multilayer dielectric stacks
- Author
- CORZINE, S. W1 ; YAN, R. H; COLDREN, L. A
[1] Univ. California at Santa Barbara, dep. electrical computer eng., Santa Barbara CA 93106, United States - Source
IEEE journal of quantum electronics. 1991, Vol 27, Num 9, pp 2086-2090 ; ref : 3 ref
- CODEN
- IEJQA7
- ISSN
- 0018-9197
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Constante diélectrique Diélectrique Etude théorique Interface Réflexion optique
- Keyword (en)
- Permittivity Dielectric materials Theoretical study Interface Optical reflection
- Keyword (es)
- Constante dieléctrica Dieléctrico Estudio teórico Interfase Reflexión óptica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70G Dielectrics, piezoelectrics, and ferroelectrics and their properties
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5484685
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/3.135163 
https://dx.doi.org/10.1109/3.135163
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