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EXELFS analysis of amorphous and crystalline silicon carbide

Author
MARTIN, J. M; MANSOT, J. L2
CNRS Ecole cent. Lyon, lab. technologie surfaces, Ecully 69131, France
[2] Inst. physique chimie matériaux, Nantes 44072, France
Source

Journal of microscopy (Print). 1991, Vol 162, pp 171-178 ; 1 ; ref : 9 ref

CODEN
JMICAR
ISSN
0022-2720
Scientific domain
Cell biology, histology; Optics
Publisher
Blackwell Science, Oxford
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Couche mince Etat amorphe Fonction distribution radiale Microscopie électronique transmission Silicium Carbure Spectrométrie perte énergie Spectrométrie EXELES
Keyword (en)
Thin film Amorphous state Radial distribution function Transmission electron microscopy Silicon Carbides Energy loss spectrometry
Keyword (es)
Capa fina Estado amorfo Función distribución radial Microscopía electrónica transmisión Silicio Carburo Espectrometría pérdida energía
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35J Surface and interface dynamics and vibrations

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5503813

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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