Possible degradation mechanism in ZnS:Mn alternating current thin-film electroluminescent display
- Author
- YUN HI LEE; IN-JAE CHUNG; MYUNG-HWAN OH
Korea inst. sci. technology, applied electronics lab., Seoul 130-650, Korea, Republic of - Source
Applied physics letters. 1991, Vol 58, Num 9, pp 962-964 ; ref : 11 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Affichage Caractérisation Couche mince Courant alternatif Dispositif électroluminescent Dégradation Fabrication Manganèse Microscopie électronique balayage Spectrométrie Auger Zinc Siliciure
- Keyword (en)
- Display Characterization Thin film Alternating current Electroluminescent device Degradation Manufacturing Manganese Scanning electron microscopy Auger electron spectrometry Zinc Silicides
- Keyword (es)
- Visualización Caracterización Capa fina Corriente alterna Dispositivo electroluminiscente Degradación Fabricación Manganeso Microscopía electrónica barrido Espectrometría Auger Zinc Siliciuro
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5548947
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.104456 
https://dx.doi.org/10.1063/1.104456
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