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A real-time photoluminescence imaging system

Author
LIVESCU, G; ANGELL, M; FILIPE, J; KNOX, W. H
AT & T Bell Laboratories, Murray Hill NJ 07974, United States
Source

Journal of electronic materials. 1990, Vol 19, Num 9, pp 937-942 ; ref : 16 ref

CODEN
JECMA5
ISSN
0361-5235
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Cartographie Etude expérimentale Organisation système Photoluminescence Semiconducteur Temps réel
Keyword (en)
Cartography Experimental study System configuration Photoluminescence Semiconductor materials Real time
Keyword (es)
Cartografía Estudio experimental Organización sistema Fotoluminiscencia Semiconductor(material) Tiempo real
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
5577722

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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