A time-resolved optical system for spatial characterization of the carrier distribution in a gate turn-off thyristor (GTO)
- Author
- BLEICHNER, H; NORDLANDER, E; ROSLING, M; BERG, S
Uppsala univ., inst. technology, Uppsala 751 21, Sweden - Source
IEEE transactions on instrumentation and measurement. 1990, Vol 39, Num 3, pp 473-478 ; ref : 10 ref
- CODEN
- IEIMAO
- ISSN
- 0018-9456
- Scientific domain
- Electronics; Physics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Absorption IR Fiabilité Mesure Mémoire Saisie donnée Système informatique Système optique Thyristor interrupteur Traitement donnée
- Keyword (en)
- Infrared absorption Reliability Measurement Memory Data acquisition Computer system Optical system Gate turn off thyristor Data processing
- Keyword (es)
- Absorción IR Fiabilidad Medida Memoria Toma dato Sistema informático Sistema óptico Tiristor interruptor Tratamiento datos
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 5579126
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/19.106275 
https://dx.doi.org/10.1109/19.106275
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