Electrical activity of Al doped silicon Σ 9 bicrystal by S.T.E.B.I.C
- Autor
- BENABBAS, T; LAVAL, J.-Y
CNRS, lab. physique solide, E.S.P.C.I., Paris 75231, France - Titulo de la conferencia
- 2nd International workshop on beam injection assessment of defects in semiconductors, Meudon-Bellevue, France, 15-18 July 1991
- Nombre de la conferencia
- BIADS'91 [Beam injection assessment of defects in semiconductors]. International workshop (2 ; Meudon-Bellevue 1991-07-15)
- Autor ( monografía)
- SIEBER, B; FARVACQUE, J.-L
CNRS, Paris, France (Funder/Sponsor)
CEA. lab. d'électronique et de technologie de l'informatique, Grenoble, France (Funder/Sponsor)
Centre National d'Etudes des Télécommunications, Issy-les-Moulineaux, France (Funder/Sponsor)
Ministère de la Recherche et de la Technologie, Paris, France (Funder/Sponsor)
Instrumat, France (Funder/Sponsor)
Oxford Instruments, United Kingdom (Funder/Sponsor)
Leica, France (Funder/Sponsor)
Univ. Lille 1, lab. structures propriétés état solide, Villeneuve d'Ascq 59655, France - Fuente
Journal de physique IV. Colloque. 1991, Vol 1, Num 6, pp C6.231-C6.236 ; ref : 12 ref
- Tipo de documento
- Conference Paper
- Idioma
- English
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70B Electronic transport in condensed matter / 001B70B20 Conductivity phenomena in semiconductors and insulators
- Disciplina
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 5615296
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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