Adjustable four-electrode electron mirror as an aberration corrector
- Author
- ZHIFENG SHAO1 ; XIAO DONG WU
[1] Univ. Chicago, Enrico Fermi inst., Chicago IL 60637, United States - Source
Applied physics letters. 1989, Vol 55, Num 26, pp 2696-2697 ; ref : 12 ref
- CODEN
- APPLAB
- ISSN
- 0003-6951
- Scientific domain
- Crystallography; Electronics; Optics; Condensed state physics
- Publisher
- American Institute of Physics, Melville, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Aberration optique Correction Microscope électronique Microscopie électronique Miroir électrostatique Miroir Optique électronique
- Keyword (en)
- Optical aberration Corrections Electron microscope Electron microscopy Electrostatic mirror Mirror Electron optics
- Keyword (es)
- Aberración óptica Corrección Microscopio electrónico Microscopía electrónica Espejo electrostático Espejo Optica electrónica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40A Electromagnetism; electron and ion optics / 001B40A75 Charged-particle beams / 001B40A75F Electron and positron beams
- Discipline
- Physics : electromagnetism
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 6781070
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1063/1.101945 
https://dx.doi.org/10.1063/1.101945
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